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Femtosecond study of the intensity dependence of electron-hole dynamics in TiO2 nanoclusters

✍ Scribed by D. Philip Colombo Jr.; Kirsten A. Roussel; Jamal Saeh; David E. Skinner; Joseph J. Cavaleri; Robert M. Bowman


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
627 KB
Volume
232
Category
Article
ISSN
0009-2614

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✦ Synopsis


The dynamics of charge carder trapping and recombination as a function of pump fluence of 20 .~ diameter TiO2 particles in aqueous solutions is measured. Trapping of photogenerated conduction band electrons occurs in less than 500 fs. The subsequent fluence-dependent decay of trapped electrons has both a fast and a slow component. The early time recombination results are interpreted by second-order kinetics. A global fit to the data predicts a bulk second-order recombination rate constant of ( 1.8 _ 0.7) × 10-lO cm 3 s-~ for trapped electrons with holes. The signal at long times is attributed to electrons ejected from the nanocluster and/or deeply trapped electrons produced via third-order kinetics, consistent with an Auger process.


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