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Femtosecond pulsed laser deposition of silicon thin films

✍ Scribed by Matthew Murray, Gin Jose, Billy Richards, Animesh Jha


Book ID
120946858
Publisher
Springer-Verlag
Year
2013
Tongue
English
Weight
741 KB
Volume
8
Category
Article
ISSN
1931-7573

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## Abstract CdS thin films were grown on quartz substrates using femtosecond pulsed laser deposition. X‐ray diffraction (XRD), atomic force microscopy (AFM), photoluminescence (PL) measurements, and optical transmission spectroscopy were used to characterize the structure and optical properties of