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Femtosecond Deflection Spectroscopy: A Novel Method to Probe Carrier Transport in Semiconductors

✍ Scribed by R. Ziebold; G. Böhne; R. G. Ulbrich


Book ID
101305739
Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
254 KB
Volume
206
Category
Article
ISSN
0370-1972

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