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Features of the Experimental Results When Measuring the Charge Center Density Distribution in the Active Region of ap-n-Junction with a Latent Inverse Layer by the Dynamic Capacitance Method

✍ Scribed by F. I. Manyakhin


Publisher
Springer US
Year
2005
Tongue
English
Weight
182 KB
Volume
48
Category
Article
ISSN
0543-1972

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