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Feature length-scale modeling of LPCVD and PECVD MEMS fabrication processes

✍ Scribed by Lawrence C. Musson; Pauline Ho; Steven J. Plimpton; Rodney C. Schmidt


Publisher
Springer-Verlag
Year
2005
Tongue
English
Weight
390 KB
Volume
12
Category
Article
ISSN
0946-7076

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