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FEA Design and Misfit Minimization for In-Depth Flaw Characterization in Metallic Plates With Eddy Current Nondestructive Testing
✍ Scribed by Cacciola, M.; Calcagno, S.; Megali, G.; Morabito, F.C.; Pellicano, D.; Versaci, M.
- Book ID
- 114652880
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 495 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0018-9464
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