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Fe and Cu in Si: Lattice sites and trapping at implantation-related defects

✍ Scribed by U. Wahl; J.G. Correia; E. Rita; J.P. Araújo; J.C. Soares

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
361 KB
Volume
253
Category
Article
ISSN
0168-583X

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The role of CSL grain boundaries in Goss [(lOO)( IOO)] texture development in Fe-3% Si has been investigated by direct crystallographic orientation measurement of (1) primary recrystallized specimens and (2) specimens following the early stages of secondary recrystallization. Goss oriented grains in