✦ LIBER ✦
Fault tree analysis—an efficient reduction algorithm : N. N. Bengiamin and B. A. Bowen. Microelectron. Reliab.15 (Suppl.), 47 (1976)
- Publisher
- Elsevier Science
- Year
- 1977
- Tongue
- English
- Weight
- 136 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0026-2714
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