✦ LIBER ✦
Fault-tolerant ICs: the reliability of TMR yield-enhanced ICs : Tim Haifley and Atul Bhatt. IEEE Trans. Reliab.R-36, 224 (1987)
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 132 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0026-2714
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