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Fault tolerance and reliability in field-programmable gate arrays

✍ Scribed by Stott, E.; Sedcole, P.; Cheung, P.

Book ID: 118681738
Publisher: The Institution of Engineering and Technology
Year: 2010
Tongue: English
Weight: 542 KB
Volume: 4
Category: Article
ISSN: 1751-8601
DOI: 10.1049/iet-cdt.2009.0011

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