Fault-simulation programs for integrated-circuit yield estimations : C. H. Stapper. IBM J. Res. Develop. 33(6) 647 (1989)

• Book ID: 103283086
• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 120 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90451-c