Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects

✍ Scribed by Sukeshwar Kannan; Bruce Kim; Byoungchul Ahn

• Book ID: 106384573
• Publisher: Springer US
• Year: 2011
• Tongue: English
• Weight: 746 KB
• Volume: 28
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/s10836-011-5263-2