Fault macromodel for switches in switched-current circuits

✍ Scribed by Wang, Cheng-Ping; Wey, Chin-Long

• Book ID: 101224894
• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 173 KB
• Volume: 26
• Category: Article
• ISSN: 0098-9886
• DOI: 10.1002/(sici)1097-007x(199801/02)26:1<93::aid-cta1>3.0.co;2-n

✦ Synopsis

Based on possible defects on the layout of a practical non-ideal switch, fault model and test generation of current copiers, basic building block of switched-current circuits, are presented in this study, where we consider two types of switches, current switches and voltage switches, which have been commonly used in both switched-current circuits and switched-capacitor circuits. Both catastrophic and parametric faults of transistors used as switches are considered. Test sequences are proposed to achieve full testability of both current copiers and switched-current circuits.