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Fault Location for Single-Circuit Line Based on Bus-Impedance Matrix Utilizing Voltage Measurements

✍ Scribed by Yuan Liao,

Book ID: 120056812
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 360 KB
Volume: 23
Category: Article
ISSN: 0885-8977
DOI: 10.1109/TPWRD.2008.915799

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