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Fault localisation in ICs by goniometric laser probing of thermal induced surface waves

✍ Scribed by S. Dilhaire; J. Altet; S. Jorez; E. Schaub; A. Rubio; W. Claeys

Book ID: 108362442
Publisher: Elsevier Science
Year: 1999
Tongue: English
Weight: 406 KB
Volume: 39
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(99)00123-7

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