Fault detection in combinational circuits using Boolean matrices : Suresh Rai and K. K. Aggarwal. Microelectron. Reliab.18, 323 (1978)

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 129 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90025-8