Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets

✍ Scribed by S. Mir; M. Lubaszewski; B. Courtois

• Publisher: Springer US
• Year: 1996
• Tongue: English
• Weight: 843 KB
• Volume: 9
• Category: Article
• ISSN: 0923-8174
• DOI: 10.1007/bf00137564