Fatigue Life of Reciproc and Mtwo Instruments Subjected to Static and Dynamic Tests

✍ Scribed by Lopes, Hélio P.; Elias, Carlos N.; Vieira, Márcia V.B.; Siqueira, José F.; Mangelli, Marcelo; Lopes, Weber S.P.; Vieira, Victor T.L.; Alves, Flávio R.F.; Oliveira, Julio C.M.; Soares, Thaiane G.

• Book ID: 122455339
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 377 KB
• Volume: 39
• Category: Article
• ISSN: 0099-2399
• DOI: 10.1016/j.joen.2012.11.048