Fatigue Crack Growth of Silicon Nitride at 1400°C: A Novel Fatigue-Induced Crack-Tip Bridging Phenomenon

✍ Scribed by Shih-Yu Liu; I-Wei Chen; Tseng-Ying Tien

• Book ID: 110826735
• Publisher: John Wiley and Sons
• Year: 1994
• Tongue: English
• Weight: 728 KB
• Volume: 77
• Category: Article
• ISSN: 0002-7820
• DOI: 10.1111/j.1151-2916.1994.tb06967.x