Fatigue and debris generation at indentation-induced cracks in silicon

✍ Scribed by Sanjit Bhowmick; Hyunmin Cha; Yeon-Gil Jung; Brian R. Lawn

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 707 KB
• Volume: 57
• Category: Article
• ISSN: 1359-6454
• DOI: 10.1016/j.actamat.2008.10.006