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Fast time-domain characterization of finite size microstrip structures

✍ Scribed by K. Aygün; B. Shanker; E. Michielssen

Publisher
John Wiley and Sons
Year
2002
Tongue
English
Weight
316 KB
Volume
15
Category
Article
ISSN
0894-3370

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✦ Synopsis

Abstract

A new fast integral‐equation‐based scheme for analysing electromagnetic transients on finite size microstrip structures is described. The scheme permits the analysis of structures comprised of perfect electrically conducting surfaces and wires along with lossless but potentially inhomogeneous dielectric regions. For typical microstrip structures, the computational complexity of the proposed analysis tool grows as O(N~t~N~sv~ log^2^ N~sv~), where N~t~ denotes the number of time steps in the analysis, N~sv~ = N~s~ + N~v~, and N~s~ and N~v~ represent the number of spatial unknowns that model currents on conducting surfaces/wires/junctions and in penetrable volumes, respectively. This complexity estimate is in stark contrast with that for classical marching‐on‐in‐time solvers, which require O(N~t~N~sv~^2^) CPU resources. Copyright © 2002 John Wiley & Sons, Ltd.

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