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Fast surface profiler by white-light interferometry by use of a new algorithm based on sampling theory

✍ Scribed by Hirabayashi, Akira ;Ogawa, Hidemitsu ;Kitagawa, Katsuichi


Book ID
115350198
Publisher
The Optical Society
Year
2002
Tongue
English
Weight
420 KB
Volume
41
Category
Article
ISSN
1559-128X

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