Fast prediction and optimization of yield in gallium arsenide large-signal MMICs
✍ Scribed by Stefano D'Agostino; Claudio Paoloni
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 227 KB
- Volume
- 8
- Category
- Article
- ISSN
- 1096-4290
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✦ Synopsis
A study on the effects of the geometrical and physical parameters of the GaAs MMIC process on the yield of large-signal circuits is presented. Large-signal yield analysis as well as large-signal yield optimization are performed using a large-signal lumped-element MESFET model related to MMIC process parameters, and suitable for implementation in commercial microwave CAD tools. The characterization of all the statistical variables of a large-signal circuit provides a better understanding of the yield behavior. In particular, the sensitivity of large-signal yield to MMIC process parameters is computed and the statistical behavior of each parameter is presented by means of yield sensitivity histograms. ᮊ 1998