✦ LIBER ✦
Fast Monte Carlo Estimation of Timing Yield With Importance Sampling and Transistor-Level Circuit Simulation
✍ Scribed by Bayrakci, A.A.; Demir, A.; Tasiran, S.
- Book ID
- 117908437
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 716 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0278-0070
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