Ion beam analysis (IBA) methods were used for the characterization of interdiffusion in thin Au-A1 multilayered systems. Conventional RBS with a high depth resolution at the specimen surface and at the interfaces (e.g. 14 nm in the depth of 255 nm) was used for gold depth profiling. In contrast to g
✦ LIBER ✦
Fast Gaussian beam technique for the analysis of composite horn-reflector antenna systems
✍ Scribed by L. Lucci; G. Pelosi; A. G. Roederer; S. Selleri; G. Toso
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 381 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
Abstract
A fast and accurate procedure for the analysis of composite horn‐reflector antenna systems with electrically large dimensions is here presented. The horn analysis is carried out exploiting the mode matching (MM) and the combined field‐integral equation (CFIE) techniques. For the reflector characterization a PO‐based Gaussian beam asymptotic technique is used. © 2004 Wiley Periodicals, Inc. Microwave Opt Technol Lett 42: 95–100, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20219
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