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Fast and Strong Nonlinearity of Thin-Film Semiconductor Interferometers Due to Intrinsic Photo- and Electrooptical Effects of the Semiconductor Interlayer

✍ Scribed by F. V. Karpushko


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
452 KB
Volume
150
Category
Article
ISSN
0370-1972

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