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Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology

✍ Scribed by Reverdy, A.; Perdu, P.; Murray, H.; de la Bardonnie, M.; Poirier, P.


Book ID
108210779
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
873 KB
Volume
48
Category
Article
ISSN
0026-2714

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