## Abstract In this paper, the microstrip circuit is analyzed in terms of the mixed potential integral equation (MPIE) by using the rooftopโfunction expansion and the blazeโfunction testing technique. The integral equation is solved by the innerโouter flexible generalized minimal residual fast Four
Fast analysis of microwave-integrated circuits using the loose GMRES-FFT method
โ Scribed by P.-L. Rui; R.-S. Chen; X. P. Feng; L. Mo; Edward K.-N. Young
- Publisher
- John Wiley and Sons
- Year
- 2005
- Tongue
- English
- Weight
- 161 KB
- Volume
- 15
- Category
- Article
- ISSN
- 1096-4290
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โฆ Synopsis
In this article, the microstrip circuit is analyzed in terms of the mixed-potential integral equation (MPIE) by means of the rooftop-function expansion and the blaze-function testing technique, and the integral equation is solved using the loose generalized minimal residual fast Fourier transform (LGMRES-FFT) method. Our numerical calculations show that LGMRES-FFT can converge faster than the conjugate gradient-fast Fourier transform (CG-FFT) method. Some typical microstrip discontinuities are analyzed and the good results obtained demonstrate the validity of the proposed algorithm.
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