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Far-infrared reflectivity of PbTe films on NaCl substrates

โœ Scribed by H. Burkhard; G. Bauer; A. Lopez-Otero


Publisher
Elsevier Science
Year
1976
Tongue
English
Weight
322 KB
Volume
18
Category
Article
ISSN
0038-1098

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Infrared reflectance studies of GaN epit
โœ Feng, Z. C.; Hou, Y. T.; Chua, S. J.; Li, M. F. ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 107 KB ๐Ÿ‘ 2 views

Infrared reflectivity measurements were performed on undoped and Si-doped GaN films grown on sapphire. After analysing the substrate reflectance accurately, a good fit to the measured reflectance has been achieved. By comparison of the measured and calculated spectra, it becomes possible to identify