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Far infrared ellipsometric measurements of (GaAs)n/(AlxGa1−xAs)n superlattice films by means of synchrotron radiation

✍ Scribed by E. Wold; J. Bremer; O. Hunderi; B.-O. Fimland


Book ID
114086391
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
172 KB
Volume
313-314
Category
Article
ISSN
0040-6090

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