Failure-rate as a function of time due to lognormal life distribution(s) of weak parts : O. Hallberg. Microelectron. Reliab. 16, 155 (1977)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 124 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)91030-2