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Failure Prediction of the Thermal Fatigue of Silicon Nitride

✍ Scribed by D. P. H. HASSELMAN; E. P. CHEN; C. L. AMMANN; J. E. DOHERTY; C. G. NESSLER

Book ID: 110814063
Publisher: John Wiley and Sons
Year: 1975
Tongue: English
Weight: 472 KB
Volume: 58
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1975.tb18771.x

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