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Failure of the Scalar Dielectric Function Approach for the Screening Modeling in Double-Gate SOI MOSFETs and in FinFETs

✍ Scribed by Toniutti, P.; Esseni, D.; Palestri, P.


Book ID
114620182
Publisher
IEEE
Year
2010
Tongue
English
Weight
276 KB
Volume
57
Category
Article
ISSN
0018-9383

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