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Failure of the Scalar Dielectric Function Approach for the Screening Modeling in Double-Gate SOI MOSFETs and in FinFETs
✍ Scribed by Toniutti, P.; Esseni, D.; Palestri, P.
- Book ID
- 114620182
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 276 KB
- Volume
- 57
- Category
- Article
- ISSN
- 0018-9383
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