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Failure Morphology after the Drop Impact Test of the Ball Grid Array Package with Lead-Free Sn-3.8Ag-0.7Cu on Cu and Ni Under-Bump Metallurgies

✍ Scribed by J.W. Jang; J.K. Lin; D.R. Frear


Publisher
Springer US
Year
2007
Tongue
English
Weight
391 KB
Volume
36
Category
Article
ISSN
0361-5235

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