✦ LIBER ✦
Failure modes in GaAs power FETs: Ohmic contact electromigration and formation of refractory oxides: A. Christou, E. Cohen and A. C. MacPherson IEEE/Proc. IRPS 82 (1981)
- Book ID
- 104157223
- Publisher
- Elsevier Science
- Year
- 1984
- Tongue
- English
- Weight
- 107 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0026-2692
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