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Failure mode analysis of oxide VCSELs in high humidity and high temperature

✍ Scribed by Suning Xie; Herrick, R.W.; Chamberlin, D.; Rosner, S.J.; McHugo, S.; Girolami, G.; Mayonte, M.; Seongsin Kim; Widjaja, W.

No coin nor oath required. For personal study only.

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