✦ LIBER ✦
Failure mechanisms in thin-film field effect transistors : K. K. Reinhartz and V. A. Russell, Solid St. Electron.9 (1966), p. 911
- Publisher
- Elsevier Science
- Year
- 1967
- Tongue
- English
- Weight
- 85 KB
- Volume
- 6
- Category
- Article
- ISSN
- 0026-2714
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