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Failure in a soft gel: Delayed failure and the dynamic yield stress

✍ Scribed by Brenner, Tom; Matsukawa, Shingo; Nishinari, Katsuyoshi; Johannsson, Ragnar

Book ID
123060286
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
484 KB
Volume
196
Category
Article
ISSN
0377-0257

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The relation between diffusion behavior of hydrogen atoms and crack branching in delayed failure was discussed. The hypotheses that diffusion paths of hydrogen atoms at crack tip broaden with increase of stress intensity factor K, and that crack branching occurs when hydrogen atoms diffuse through