𝔖 Bobbio Scriptorium

✦ LIBER ✦

Failure analysis of passive devices : John E. Mann. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 89

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 132 KB
Volume: 18
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(78)90028-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electrical overstress failure analysis i

Electrical overstress failure analysis in microcircuits : J. S. Smith. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 41

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 132 KB

Scanning eletron microscopy for complex

Scanning eletron microscopy for complex microcircuit analysis : John J. Bart. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 108

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 108 KB

Electrostatic damage susceptibility of s

Electrostatic damage susceptibility of semiconductor devices : L. A. Schreier. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 151

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 116 KB

Electromigration failure under pulse tes

Electromigration failure under pulse test conditions : R. J. Miller. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 241

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 250 KB

Accelerated life testing for LSI failure

Accelerated life testing for LSI failure mechanisms : C. H. Zierdt, Jr. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 76

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 132 KB

Process testing for reliability control

Process testing for reliability control : Walter H. Schroen. Proc. IEEE Reliab. Phys. Symp., San Diego (18–20 April 1978), p. 81

📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 253 KB