Failure analysis of memory organization for utilization in a self-repair memory system : S. A. Szygenda and M. J. Flynn. IEEE Trans. Reliab.R-20, No. 2 (1971), p. 64

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 225 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90615-4