✦ LIBER ✦
Failure Analysis of InP-Based Edge-Emitting Buried Heterostructure Laser Diodes Degraded by Forward-Biased Electrostatic Discharge Tests
✍ Scribed by Ichikawa, Hiroyuki; Matsukawa, Shinji; Hamada, Kotaro; Yamaguchi, Akira; Nakabayashi, Takashi
- Book ID
- 125491156
- Publisher
- Institute of Pure and Applied Physics
- Year
- 2009
- Tongue
- English
- Weight
- 315 KB
- Volume
- 48
- Category
- Article
- ISSN
- 0021-4922
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