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๐Ÿ“

Failure Analysis: High Technology Devices

โœ Scribed by Daniel J. D. Sullivan; Eric J. Carleton


Publisher
De Gruyter
Year
2022
Tongue
English
Leaves
128
Category
Library

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โœฆ Synopsis


The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

  • Covers methods and analytical techniques used to find root cause for failures in high technology devices.
  • Examples from real experiences in failure analysis laboratories.
  • Descriptions of how to perform the wok with details, not just theory.

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