Failure Analysis: High Technology Devices
โ Scribed by Daniel J. D. Sullivan; Eric J. Carleton
- Publisher
- De Gruyter
- Year
- 2022
- Tongue
- English
- Leaves
- 128
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
- Covers methods and analytical techniques used to find root cause for failures in high technology devices.
- Examples from real experiences in failure analysis laboratories.
- Descriptions of how to perform the wok with details, not just theory.
๐ SIMILAR VOLUMES
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<p><span>The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies. </span></p>
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