Failure Analysis (de Gruyter Stem)

✍ Scribed by Daniel J D Eric J Sullivan Carleton

• Publisher: de Gruyter
• Year: 2022
• Tongue: English
• Leaves: 131
• Category: Library

✦ Synopsis

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

✦ Table of Contents

Contents
Chapter 1 Introduction to FA
Chapter 2 Why is FA important?
Chapter 3 Planning out an FA
Chapter 4 Typical types of failure mechanisms
Chapter 5 Destructive versus nondestructive analysis
Chapter 6 Optical Microscopy (OM)
Chapter 7 Scanning Acoustic Microscopy/Tomography (SAM or SAT)
Chapter 8 X-ray imaging (2D and 3D)
Chapter 9 Time Domain Reflectometry (TDR)
Chapter 10 Selecting the path before destructive analysis begins
Chapter 11 Destructive work
Chapter 12 Electrical Failure Analysis (EFA)
Chapter 13 EMMI/OBIRCH/IR
Chapter 14 Cross sections (X-sections)
Chapter 15 Parallel lapping (p-lap)
Chapter 16 Focused Ion Beam (FIB)
Chapter 17 Scanning Electron Microscopy (SEM)
Chapter 18 Transmission Electron Microscopy (TEM)
Chapter 19 Energy Dispersive X-ray spectroscopy (EDX)
Chapter 20 Use of additional materials analytical techniques and processes
Chapter 21 How should these results be used?
References
Appendix
List of figures
Index