✦ LIBER ✦
Failure-analysis-based test chip design for quick yield improvement
✍ Scribed by Chisato Hashimoto; Shigeru Nakajima
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 712 KB
- Volume
- 36
- Category
- Article
- ISSN
- 0026-2714
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