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Facility for electrical and mechanical tests at cryogenic temperature

✍ Scribed by Akopjan, D.G.; Bondarchuk, A.N.; Vasiljev, V.N.; Dedurin, A.M.; Kalinin, V.V.; Karnaukh, V.A.; Korsunsky, V.E.; Kostenko, A.I.; Trokhachev, G.V.; Filatov, V.V.; Filatov, O.G.; Chvartatsky, R.V.; Chegodaev, A.T.

Book ID: 114547422
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 202 KB
Volume: 28
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.119951

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