## Abstract The faceting of grain boundaries (GB) under annealing in phosphorus‐doped polysilicon films, produced by low‐pressure chemical vapor deposition, has been investigated by transmission electron microscopy. It has been shown that the facet types and facet density depend on annealing temper
✦ LIBER ✦
Faceting–roughening of twin grain boundaries
✍ Scribed by B. B. Straumal; B. Baretzky; O. A. Kogtenkova; A. S. Gornakova; V. G. Sursaeva
- Publisher
- Springer
- Year
- 2011
- Tongue
- English
- Weight
- 550 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0022-2461
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