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Fabrication of sub-quarter-micron grating patterns by employing DUV holographic lithography

✍ Scribed by L.A. Wang; C.H. Lin; J.H. Chen


Book ID
104306555
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
790 KB
Volume
46
Category
Article
ISSN
0167-9317

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✦ Synopsis


Sub-quarter-micron grating patterns with period as fine as 0.22 p.m have been obtained by combining DUV holographic lithography and silylation technique for the first time. A traditional chemical amplified resist (JSR KRF/K2G) originally working for single layer process at 248 nm wavelength was used for silylation. The silylation selectivity was improved by process control and a photoresist pattern with an aspect ration of 4 was obtained.