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Fabrication of high-aspect-ratio silicon nanostructures using near-field scanning optical lithography and silicon anisotropic wet-etching process

✍ Scribed by S.J. Kwon; Y.M. Jeong; S.H. Jeong


Publisher
Springer
Year
2006
Tongue
English
Weight
536 KB
Volume
86
Category
Article
ISSN
1432-0630

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## Abstract Metal‐assisted etching is used in conjunction with block‐copolymer lithography to create ordered and densely‐packed arrays of high‐aspect‐ratio single‐crystal silicon nanowires with uniform crystallographic orientations. Nanowires with diameters and spacings down to 19 nm and 10 nm, res