Fabrication of Al thin wire by utilizing controlled accumulation of atoms due to electromigration

✍ Scribed by M. Saka; R. Nakanishi

• Book ID: 113789616
• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 187 KB
• Volume: 60
• Category: Article
• ISSN: 0167-577X
• DOI: 10.1016/j.matlet.2005.12.107