Fabrication and program/erase characteristics of 30-nm SONOS nonvolatile memory devices

✍ Scribed by Suk-Kang Sung, ; Il-Han Park, ; Chang Ju Lee, ; Yong Kyu Lee, ; Jong Duk Lee, ; Byung-Gook Park, ; Soo Doo Chae, ; Chung Woo Kim,

• Book ID: 120374149
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 751 KB
• Volume: 2
• Category: Article
• ISSN: 1536-125X
• DOI: 10.1109/TNANO.2003.820779